Nano-Scale Movement Induced In Graphene Ripples by Multi-Probe Microscopy

  • Mona Alyobi
  • Chris Barnett
  • Richard Cobley
DOI: http://dx.doi.org/10.24178/ijare.2017.3.2.22

Abstract

Abstract— An Omicron low temperature multi-probe technique is used for manipulation of mechanically exfoliated suspended and attached graphene sheets on SiO2 substrates. Scanning electron microscopy (SEM) and Raman spectroscopy are used to detect the graphene sheets and determine their thicknesses and quality, respectively. The interaction of the etched tungsten tip with the graphene is used to lift and release the sheet and induce artificial ripples. Both suspended and attached sheets onto the substrates show different behaviour in response to bias voltage.


IndexTerms: graphene,multi-probe microscopy, ripples.


 

Volume 3, Issue 2, International Journal of Advanced Research in Engineering (IJARE) (Online ISSN 2412-4362)
Published
Jun 24, 2017
How to Cite
ALYOBI, Mona; BARNETT, Chris; COBLEY, Richard. Nano-Scale Movement Induced In Graphene Ripples by Multi-Probe Microscopy. International Journal of Advanced Research in Engineering, [S.l.], v. 3, n. 2, p. 22-25, june 2017. ISSN 2412-4362. Available at: <https://researchplusjournal.com/index.php/IJARE/article/view/278>. Date accessed: 15 oct. 2025. doi: http://dx.doi.org/10.24178/ijare.2017.3.2.22.
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Vol 3 No 2 (2017): International Journal of Advanced Research in Engineering
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Articles
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